
WAYNE KERR
High Frequency LCR Meter
6500P
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- Precise high frequency impedance measurements
- Characterize components to 120MHz (65120P)
- Measurement Time: High-speed measurements: 25 ms/meas.
- 0.05% basic measurement accuracy
- Comprehensive measurement functions
- Easy to use with large TFT touch screen
- Intuitive user interface
- Fully programmable over GPIB
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WAYNE KERR
LCR Meter
4100
(41100)
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- Test components from 20Hz to 1 MHz
- 0.1% basic accuracy
- < 25ms measurement time
- Parameters C, L, Z, Y, X, B, Rac, Rdc, G, Q, D, Ø
- Single or two test operation
- Up to four parameters may be displayed (two test mode)
- Drive level from 10mV to 2Vrms
- Scale mode with measurement target limits
- Operator mode with target limits
- +2V internal or up to ±40Vdc external bias
- Measurement setup Save and Recall
- GPIB / IEEE-488, USB, LAN and RS-232 interfaces
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Chroma
Automatic Component Analyzer
3302
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- Frequency: 20Hz ~ 1MHz
- Fast measurement speed - up to 80 measurements per second
- Basic Accuracy: 0.1% basic accuracy
- Telecom measurement functions
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Chroma
BIAS Current Source
1310
1320
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- Frequency response : 20Hz~200kHz
- 0.001A~10.00A, 90W output capability
- Forward / Reverse current switching capability
- Bias current sweep (2~11points), automatic or manual trigger, for core characteristics analysis
- 0.001Ω~199.99Ω DCR measurement capability
- Long term continued maximum power output capability
- Standard GPIB, Handler interface
- Direct controlled by LCR Meter 3302
- 0.01mΩ~199.99Ω DCR measurement capability
- 50 internal instruments setups for store/recall capability
- Single bias current output timer capability (24 hours)
- Long term continued maximum power output capability
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Chroma
Milliohm Meter
16502
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- Range: 20mΩ ~ 2MΩ
- Measurement time: 65ms~650ms
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Chroma
Impulsing Winding Tester
19301A
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- Apply high/low inductance test (0.1uH~100uH)
- 10V~1000V impulse voltage test, with 0.06V test resolution
- 18mS high speed test (P1.0 for ACQ)
- Inductance contact check function
- Inductance differential voltage compensation function
- High impulse test sampling rate (200MHz),10bits
- Breakdown Voltage Analysis (BDV)
- Low voltage range to increase the sensibility of waveform analysis (25V/50V/100V/200V/400V/800V/1000V)
- Traditional Chinese/Simplified Chinese/English user interface
- USB port for storing waveform &screen capture
- Graphical color display
- Standard LAN, USB and RS232 interface
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